Iain D. Boyd
James E. Knott Professor of Engineering

ADDRESS: 3012 FXB
PHONE: (734)615-3281
FAX: (unsecured): (734)763-0578
E-MAIL: iainboyd@umich.edu
Personal Web Page: http://aerospace.engin.umich.edu/people/faculty/boyd/

Some Recent Publications:

(Click "Publications" on the side-bar for more)

Journals

  1. Chen, S. Y. and Boyd, I. D., "Chemical equilibrium analysis of silicon carbide oxidation in oxygen and air", Journal of the American Ceramic Society, pp. 1-13, 2019, doi:10.1111/jace.16272
  2. Hanquist, K. M., and Boyd, I. D., "Plasma Assisted Cooling of Hot Surfaces on Hypersonic Vehicles", Frontiers in Physics 7:9, 2019; doi:10.3389/fphy.2019.00009
  3. Chen, S. Y., Boyd, I. D., Martin, N. C. and Fletcher, D. G., "Modeling of Emission Spectra in Nonequilibrium Plasmas for Testing Pyrolyzing Ablators", Journal of Thermophysics and Heat Transfer, pp.1-10, 2019, doi: 10.2514/1.T5615
  4. Eyi, S., Hanquist, K. M., and Boyd, I. D., "Aerothermodynamic Design Optimization of Hypersonic Vehicles", Journal of Thermophysics and Heat Transfer (2018): pp. 1-15; doi:10.2514/1.T5523
  5. Cusson, S. E., Georgin, M. P., Dragnea, H. C., Dale, E. T., Dhaliwal, V., Boyd, I. D., and Gallimore, A. D., "On Channel Interactions in Nested Hall Thrusters", Journal of Applied Physics, Vol. 123, Issue 13, 2018, 133303

Conferences

  1. Chen, S. Y. and Boyd, I. D., "A Chemical Equilibrium Analysis Approach to Oxidation and Nitridation of Silicon Carbide", AIAA Scitech 2019 Forum, AIAA Paper 2019-0243, January 2019
  2. Hanquist, K. M. and Boyd, I. D., "Modeling of Electronically Excited Oxygen in O2-Ar Shock Tube Studies", AIAA Avaiation 2019 Forum, AIAA Paper 2019-3567, June 2019
  3. Kaplan, C. I. and Boyd, I. D., "Drag Analysis of a Tumbling CubeSat Experiencing Orbital Decay", AIAA Avaiation 2019 Forum, AIAA Paper 2019-3264, June 2019
  4. Poovathingal, S. J., Kruszelnicki, J., Boyd, I. D., and Kushner, M. J., "NonEquilibrium Processes in Plasma Torches of Inductively Coupled Plasma Facilities", AIAA Avaiation 2019 Forum, AIAA Paper 2019-3566, June 2019
  5. Chen, S. Y. and Boyd, I. D., "Analysis of the Silicon Carbide Boundary Layer under Passive and Active Oxidation", AIAA Aviation 2019 Forum, AIAA Paper 2019-3261, June 2019